Equipments

High -Speed Computing Server
Function:
High-speed computing server
Specification:
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Intel® Xeon® processor E5-2600 v4
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DDR4 memory (24 DIMM slots)
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Seven I / O slots
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Intel C610 series chipset
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Eight 8TB 3.5 "hard drives (64T)
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RAID controller
4200-SCS Semiconductor Characterization Technology System
Function:
Semiconductor characteristic test
Specification:
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Provide four 4225-PMU four SMU systems, provide 8 channels to support the traditional pulse mode
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Arbitrary waveform mode (ARB), each pulse channel contains an embedded high durability output relay (solid state relay)
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Ultra-flexible and versatile system for a wide range of parametric tests including very low-level DC measurements, CV and ultra-fast IV for pulse and transient tests


50 Amp High Power Supply Instrument
Keithley 2651A
Function:
Low-voltage high-current power supply
Specification:
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Pulse power 2,000W (± 40V, ± 50A)
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DC power supply 200W (± 10V @ ± 20A, ± 20V @ ± 10A, ± 40V @ ± 5A)
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1pA resolution enables extremely low leakage current measurement
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1μs per point (1MHz), 18-bit sampling
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1% to 100% pulse width modulation (PWM) drive scheme and device-related drive stimulation
Dual Spectrum Infrared Spectrometer
Function:
Red light and infrared light measurement
Specification:
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Basic and advanced data processing program customization
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Spectral arithmetic calculation
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Equation Editor
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Spectral contrast
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Prediction of PLS / PCR / Beer Law
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Development of quantitative method for Beer's law

3D Stereo Microscope Keyence VHX-5000
Function:
3D image presentation on the surface of the device
Specification:
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High resolution and large depth of field
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20-2500 magnification
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Continuous image enlargement
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Optical design of confocal point
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3D image rendering
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Working distance: 6.5mm ~ 25.5mm
Thermal Image Analysis System for Regional Telemetry Temperature
Function:
Thermal image analysis
Specification:
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Regional emissivity correction
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Automatically calculate the total area of the emissivity
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Zoom and rotate 90 degrees to store and analyze
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Multi-point temperature display and annotation
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Zone temperature curve
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Dynamic rising section temperature curve
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Automatic thermal analysis and other analyses
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Three-dimensional temperature trend
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Zone resistance analysis


Battery Cycle Tester BCS-815
Function:
Lithium battery life reliability test
Specification:
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High quality EIS
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10 kHz to 10 MHz full scan
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18-bit A / D converter (40μV resolution)
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HPC measurement can be as low as 6.3 ppm
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Voltage measurement from 0 V to 9 V
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Hybrid module (BCS-805 / 810/815)
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2ms grab time

King Design KD-128A Vibration and shock environmental equipment
Specification:
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Bottom plate size (mm) 850 x 1,260
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Testing height 300 ~ 1300 mm, 300 ~ 1800 mm, 300~ 2000 mm
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Peak Load(kg) 60 / 80 / 100
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Buffer Device Hydraulic Buffer
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Level Control Method By Line Control
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Outline Dimension (mm) 850 x 1560 x 2250, 850 x 1560 x 2750, 850 x 1560 x 2950
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Electrical Requirement 220 V 1f / 5A
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Air Pressure Requirement 6
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Weight 450(kg)

Vibration Machine
Function:
Vehicle Electronics Components
Specification:
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Specimen with vehicle weight: ≦ 300 kg
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Rated peak sine force 600kgf
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The largest specimen size: 400 × 400 mm
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Max Peak 1.8 m/s
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Maximum No-loda acceleration: 100g vibration
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Vibration wave type: sine wave, random wave, shock wave
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Maximum displacement: 51 mm (MAX 51mm)
T3STER Booster
Specification:
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measurement of power devices such as power MOSFETs, IGBTs, etc.
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measurement of power LED assemblies and LED lines
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measurement of large area VLSI chips using the substrate diode
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Any number of booster devices can be connected to the system to form a multi-channel high power testing setup used for reliability testing applications.
Weather Simulator Chamber
Function:
Simulated Weather Environment
Specification:
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Simulation of weather changes in a variety of climate changes
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Relative Humidity
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Irradiance
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Incoming Deionized Water Quality
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Lamp Cooling Water Temperature
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Countdown in Time or Radiant Exposure
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Phase Type and Duration
Thermal Resistance Measurement System with booster
Specification:
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Forward current (IF): 0.1~3A(0.1A STEP)
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Forward voltage (VF): ~20V,~100V (*selection)
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Power on setting time (PW): 50µs~3600sec (1sec STEP)
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Detection timing (td): 10µs~
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Vm detection range: 0.001~99.9V
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Number of PW applications: one time or maximum 50 times
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Multi-element switching function: maximum 100 ch
BCS-815 - Battery Tester - Bio-Logic Science Instruments
Specification:
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Control resolution: Down to 80 nA
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Measurement resolution: Down to 20 nA (18 bit)
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Accuracy: < 0.05% of value ±0.015% of FSR < 0.1% of value ±0.015% of FSR (1 A range) < 0.3% of value ±0.04% of FSR (10 A range)

TFG 3210E 10MHz DDS Function Generator
Specification:
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Max. output frequency 5MHz / 10MHz / 15MHz / 20MH
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Sampling rate 100Msa/s, vertical resolution 8 bits, waveform length 1024 points
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Min.1mV (50Ω) waveform output with good stability
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Modulations: FM, FSK, PSK, ASK
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Standard parts: 200MHz frequency counter
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Optional parts: RS-232 interface, power amplifier
ABM 9306D Dual-Tracking power supply
Specification:
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Power source ACV: 100/120/220/240±10%, 60/50Hz
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Operation temp. & humidity: 5 °С to 40 °С, < 80%
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Storage temp. & humidity: –10 °С to 70 °С, < 80%
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Dimensions: 270(W) × 156(H) × 462(D)min
Confocal Scanning Acoustic microscope(C-SAM) PVA TePla AG
Specification:
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Analysis of samples in the ultrasound frequency range up to 400 MHz
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Designed by default for a transducer
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Equipped with a graphical user interface for ease of operation and flexible applicability
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The sample bath and the scanner can be adapted to customer requirements.
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Scanning range: x = 320 mm; y = 320 mm
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1 giga-sample ADC
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Optional 2.5 giga-sample/5 giga-sample ADC
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Smallest pixel size 0.5 μm
Scanning Electron Microscope JSM-IT200 InTouchScopeTM
Function:
Material Analysis
Specification:
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Operation Guided by Specimen Exchange Navi
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Seamless transition from optical image to SEM image
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Preset multiple analysis positions across specimen set
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Live analysis-displaying x-ray spectrum and main constituent elements with elements of interest.
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Faster Report Generation with SMILE VIEW TM Lab.
XENON Lamp durability tester
Function:
Simulated Weather Environment
Specification:
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Relative Humidity
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Irradiance
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Incoming Deionized Water Quality
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Lamp Cooling Water Temperature
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Countdown in Time or Radiant Exposure
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Phase Type and Duration
Ultimaker S3 3D Printer
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Network connectivity: Print via Wi-Fi, LAN, cloud, or with USB
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Touch screen: Effortless operation via an award-winning user interface
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Advanced active leveling: Reliable first-layer adhesion, enables unattended use
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Front enclosure: Improved printing environment for better print results
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Flow sensor: Stay informed when filament runs out to increase print success
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Easy setup and monitoring: With NFC material recognition and internal camera
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Composite materials compatible: Print parts with high strength and unique properties
Reliability Test System-Cascade Microtech 1164
Function:
IC reliability test
Specification:
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Provide a full range of test applications – EM, SM, BTS, TDDB, SILC, MTTDDB, HCI, and BTI.
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A single system can run any combination of these test applications simultaneously.
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The system can perform package-level reliability and / or wafer-level reliability.
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Independent notebook ovens provide many concurrent (simultaneous) temperatures for package-level reliability.

Temperature and Humidity Cycle Tester
Specification:
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Temperature range: -70 ° C to + 190 ° C (-94 ° F to + 375 ° F)
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Humidity range: maintain relative humidity of 10% to 98% at 7 ° C (+ 45 ° F) ~ + 85 ° C (+ 185 ° F)
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Control accuracy: ± 0.5 ° C (± 1 ° F); ± 3% relative humidity after steady state conditions
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Cooling capacity: + 85 ° C (+ 185 ° F) to -40 ° C within 20 minutes (-40 ° F)
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Heating capacity: + 24 ° C (+ 75 ° F) to + 190 ° C (+ 375 ° F) within 30 minutes, -68 ° C (-90 ° F) to + 24 ° C (+ 75 ° F) In 15 minutes
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Live load capacity: -68 ° C (-90 ° F) 600 watts.
Integral sphere
Specification:
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Internal diameter of 30 centimeter
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In full accordance with the CIE127 standard for LED luminous flux measurement standards
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Equipped with 300 mm diameter side light measurement hole
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Compatible LED-5xx, -6xx and -81x series of LED test fixture, and applies to LED-850 series TEC test fixture
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Integral ball inside a lamp holder, you can fix the object to be measured in the center of the ball
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With auxiliary light source
Glove Box with Gas Purification System Sci-Lab VIGOR
Specification:
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Glove Ports: Aluminium; O-type sealing ring; Diameter: 220mm
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Gloves: Butyl rubber; Thickness: 0.4mm
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Feedthroughs: KF 40 flanges sealed with blank caps
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Filters: Mounted on the vents
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Material: 304 SS; White baking varnish; Brushed inner surface

NISENE Jet ETCH Pro JEPT10 Decapsulation System
Specification:
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Patented Pump
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Robust Heat Exchanger
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Safety Features
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Advanced Software
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Ease-of-Use
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Next-generation Technology
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Affordable
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Industry-leading Warranty
SE Testsystems Auto Three Axes (XYZ) Load Tseter 9505SF
Specification:
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Units: 5kgf、20kgf、50kgf
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Resolution: 1gf 、 1gf 、 10gf
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Speed range: 1-200mm/min
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Transmission: Ball Screw
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Drive motor: Servo motor (3 axes)
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Dimension: 900 (W)×6200(D)×1000 (H)mm
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Power: AC 100V or 200V
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Weight: 170kg
Electronic Load- High Current DC Load NHR4700- 3TP
Specification:
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High-resolution waveform capture for analysis of dynamic transients
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18 built-in, precision voltage, current, power and timing measurements that eliminate additional dedicated measurement instruments
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Isolated digital inputs and outputs for test fixture support
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Optional touch-panel user interface
FT-IR Spectroscopy Microscope
Function:
Spectrum Two FTIR
Specification:
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Basic and advanced data manipulation routines
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Spectral arithmetic calculations with custom
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Equations Editor
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COMPARE spectral comparison
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PLS/PCR/Beer’s Law predictions
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Beer’s Law Quant method development
ABM Hybrid DC Power Supply PS9611A
Specification:
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Type: AC/DC
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Mode: Linear
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Output Voltage: Max, V 30
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Rated Current: A 6
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No. of Channels: 3
SERIES 2260B Multi-Range Pogrammable DC Power Supplies
Specification:
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Programmable voltage or current rise and fall times from 0.1V/s to 1600V/s or 0.01A/s to 216A/s
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Constant current priority setting
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Programmable output resistance
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Internal test sequence mode
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Series or parallel configurable
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Fast discharge capability and 1ms transient recovery time to load changes.
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Fit six 360W, three 720W, or two 1080W units in a standard rack width
MulitView 4000
Specification:
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Raman Excitation source: 457nm SLM laser, 50mW
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High sensitivity Raman Spectrograph (4 gratings)
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High sensitivity TE Cooled CCD detector (2000x256 pixels)
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Spectral Range : 200-1050nm
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SPM Sample Scanning range: 85 micron x 85 micron; SPM Probe Scanning range: 30 micron x 30 micron
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Supports a variety of standard AFM/SPM imaging modes. Image and line profiles displayed in real time.
Decapsulation System Teltec Semiconductor Pacific Limited
Specification:
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Flexible Etch Time: 1 - 1800 seconds
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One-hundred (100) Etch Recipe Storage
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Wide Temperature Range: 20°C - 250°C
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Thirteen (13) Mixed-acid Ratios
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Wide Range of Etchant Acid Volumes: 1 mL/min - 10 mL/min
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Wide range of user selectable acid mix ratios
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Ability to perform multi-step decapsulation processes
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Pulse etching enabling rapid decapping with minimal acid consumption

TBLC08 LISN
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Frequency range: 9 kHz to 30 MHz
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Impedance: 50 Ω ║ (50 µH + 5 Ω)
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Artificial hand: 220 pF + 511 Ω
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Switchable PE: 50 Ω ║ 50 µH
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Limiter / attenuator: 150 kHz to 30 MHz; 10 dB
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Air core inductors
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Line voltage: max. 240V / 50 – 60 Hz, CAT ‖
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Max. current: 8A @ 23°C
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DUT socket: country specific
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Measurement connector: 50 Ω BNC
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Power connector: IEC 60320 C13
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Operating Temperature Range: +5°C … + 40°C; 5% to 80% RH
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Safety: Safety Class I, IEC 1010-01
